As Semiconductor designs continue to scale in complexity and integration, ensuring that chips can be tested thoroughly and economically has become a strategic priority. Manufacturing defects, process variations, and subtle design issues can render even functionally correct designs unusable if they are not detected efficiently during production. Design for Testability https://edwinglptx.wikijournalist.com/91700/vlsipedia_as_a_knowledge_hub_for_modern_vlsi_education